This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text,... more...

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning... more...

Introducing graduate students in physics, optics, materials science and electrical engineering to surface plasmons, this book also covers guided modes at planar interfaces of metamaterials with negative refractive index. The physics of localized and propagating surface plasmons, on planar films, gratings, nanowires and nanoparticles, is developed using both analytical and numerical techniques. Guided modes at the interfaces between materials with any... more...